Introduction to Testing: Testing Philosophy, Role of Testing, Analog and Digital Circuit Testing, Types of Testing.
Fault Modeling: Defects, Errors, and Faults; Functional Versus Structural Testing; Levels of Fault Models; Fault
Equivalence and Fault Collapsing. Test Methods: Logic and Fault Simulation, Simulation for Design Verification,
Simulation for Test Evaluation, Modeling Circuits for Simulation, Algorithms for Fault Simulation. Test Generation:
Combinational Circuit Test Generation- Structural vs. Functional Test, ATPG Algebras, Test Generation Systems,
Test Compaction; Sequential Circuit Test Generation. Memory Test and Built-In-Self-Test: Memory Density and
Defect Trends, Memory Test Levels, March Tests, RAM Test Hierarchy, Cache RAM and Functional ROM Chip
Testing, Memory Built-In Self-Test. Delay Test: Delay Test Problem, Path-Delay Test, Transition Faults, Delay Test
Methodologies. Logic Fault Diagnosis: Combinational Logic Diagnosis, Scan Chain Diagnosis, Logic BIST
Diagnosis.